Measurements and Testbenches
R2026bMeasurement of properties such as gain, noise figure, and intercept points (IPs) in RF systems is crucial to the system design and analysis. Such measurements are accomplished by placing a device under test (DUT) in a testbench. Use the testbenches blocks to measure RF properties and verify the response of the DUT.
Blocks
 | Transducer Gain Testbench | Measures transducer gain of system |
 | Noise Figure Testbench | Measures noise figure of system |
 | OIP3 Testbench | Measure output third intercept point of system |
 | IIP3 Testbench | Measure input third intercept point of system |
 | OIP2 Testbench | Measure output second intercept point of system |
 | IIP2 Testbench | Measure input second intercept point of system |
 | S-Parameter Testbench | Measure S-parameters of system |
Featured Examples
Validating IP2/IP3 Using Complex Signals
Run a two-tone experiment to measure the second- and third-order intercept points of an amplifier.
Spot Noise Data in Amplifiers and Effects on Measured Noise Figure
A test bench model to describe the noise introduced by a 2-port device.
Analysis of Frequency Response of RF System
Analyze the frequency response of an RF system.
Measure S-Parameter of Nonlinear System
Use the S-Parameter Testbench block to measure the S-parameters of a nonlinear system. The system shown here includes a device under test (DUT) with a linear filter followed by a nonlinear amplifier. The system allows an external steady state input that is switched off initially. When the DUT is nonlinear, the stimulus signal created in the S-Parameter Testbench block must be small enough to operate in the linear region.
