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Model-in-the-Loop for Embedded System Test (MiLEST) preliminary version

version (1.51 MB) by Justyna Zander
This is a draft preliminary version of the MiLEST Framework for eduction purpose.


Updated 11 Mar 2013

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In Model-in-the-Loop for Embedded System Test (MiLEST) the developed signal-feature – oriented paradigm allows the abstract description of signals and their properties. It addresses the problem of missing reference signal flows as well as the issue of systematic test data selection. Numerous signal features are identified. Furthermore, predefined test patterns help build hierarchical test specifications, which enables a construc-tion of the test specification along modular divide-and-conquer principles. The processing of both discrete and continuous signals is possible, so that the hybrid behavior of embedded systems can be addressed.
The testing with MiLEST starts in the requirements phase and goes down to the test execution level. The essential steps in this test process are automated, such as the test data generation and test evaluation to name the most important.

Cite As

Justyna Zander (2021). Model-in-the-Loop for Embedded System Test (MiLEST) preliminary version (, MATLAB Central File Exchange. Retrieved .

MATLAB Release Compatibility
Created with R2007b
Compatible with any release
Platform Compatibility
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Transformation of SUT to MiLEST model/