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Model-Based Testing for Embedded Systems

Model-Based Testing for Embedded Systems

Written for professionals, Model-Based Testing for Embedded Systems provides a comprehensive overview of the current state of model-based testing (MBT) for embedded systems—including potential breakthroughs, challenges, and achievements—observed from numerous perspectives. The book is a compilation of 22 contributions from world-renowned industrial and academic authors. Topics include automatic test generation, integration and multilevel testing, specific approaches, and testing at the lower levels of development.

MATLAB and Simulink are used to illustrate numerous examples in the book.



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Justyna Zander, Harvard University
Ina Schieferdecker, Fraunhofer Institute FOKUS
Pieter J. Mosterman, MathWorks

CRC Press, Inc., 2012

ISBN: 978-1-4398-1845-9
Language: English